Fault Models and Coverage
Understanding fault models and measuring test coverage.
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Technical Concept & Silicon Architecture
In digital ASIC and FPGA design, Fault Models and Coverage is a critical engineering milestone within the Design for Test flow. Understanding the physical tradeoffs between timing margin (setup/hold slack), silicon die area, routing congestion, and dynamic/leakage power is fundamental to signing off working silicon.
When implementing this stage in standard EDA environments, engineers must balance architectural intent with cell library characterization files (.lib / Liberty models), technology LEF files, and design constraints specified via Synopsys Design Constraints (SDC).
EDA Tooling & Scripting Reference
Standard EDA tools (Synopsys PrimeTime/Design Compiler, Cadence Innovus/Tempus, and open-source OpenROAD/OpenLane) expose TCL interfaces for automation. Below is an example command configuration for this design domain:
# SiliconPath :: Technical Verification Script
set_operating_conditions -analysis_type on_chip_variation
set_clock_uncertainty -setup 0.080 [get_clocks core_clk]
set_clock_uncertainty -hold 0.040 [get_clocks core_clk]
# Inspect timing slack across critical endpoints:
report_timing -delay_type max -max_paths 5 -nworst 1 \
-path_type full_clock_expanded -significant_digits 3
Signoff Verification Checklist
- Multi-Corner PVT Validation: Always ensure constraints are met across all fast-fast (0°C/1.1V) and slow-slow (125°C/0.9V) process corners simultaneously.
- Clock Tree Reconvergence (CRPR): Enable Common Path Pessimism Removal to prevent artificial setup/hold timing violations on shared clock tree branches.
- DRC/LVS Cleanliness: Prove standard cell placement and signal metal wires do not create antenna ratio violations or design rule checks.
“In the context of fault models and coverage, what is the primary cause of hold violations, and why are hold violations considered frequency-independent during silicon testing?”